Learning Path

Failure Analysis in Semiconductors

Semiconductor Device Physics Fundamentals → Failure Analysis Process and Case Studies

9 Knowledge Nodes · 9 Learning Steps · v0 Active

This learning path equips professional engineers with the knowledge and skills to conduct failure analysis on semiconductor devices. It covers device physics fundamentals, failure modes and mechanisms, fault isolation techniques, and advanced characterization methods including FIB, SEM, TEM, and EDS. The path emphasizes practical application and hands-on techniques essential for a career in failure analysis.

Knowledge Map

Explore the complete knowledge graph with this learning route highlighted, or switch to Route to focus on the route topology.

Drag to pan · Scroll to zoom · Click a node to inspect

Click a node to preview its details without leaving this path. Scroll to zoom, or open Fullscreen to explore the whole map.

Learning Route

9 learning steps · 3 phases. Click any step to inspect it and see it on the Knowledge Map.

Phase 1

Foundation

3 steps

Phase 2

Core Concepts

3 steps

Phase 3

Advanced Topics

3 steps