Learning Path

Semiconductor Device Reliability Testing

Semiconductor Device Physics Fundamentals → Statistical Analysis for Reliability Data

10 Knowledge Nodes · 10 Learning Steps · v0 Active

This advanced professional learning path equips engineers with the knowledge to apply reliability tests to semiconductor devices, focusing on ESD, latch-up, hot carrier injection, negative bias temperature instability, and accelerated testing. It builds on advanced device physics to understand failure mechanisms, test methods, and qualification standards.

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Learning Route

10 learning steps · 3 phases. Click any step to inspect it and see it on the Knowledge Map.

Phase 1

Foundation

4 steps

Phase 2

Core Concepts

3 steps

Phase 3

Advanced Topics

3 steps