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SEM and TEM for Materials Characterization

Fundamentals of Microscopy → Nanomaterial Characterization

This learning path guides students through the principles, techniques, and applications of scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization. It covers essential imaging modes, analytical techniques such as EDX and EELS, diffraction, sample preparation, and applications to nanomaterials, building from fundamental concepts to advanced practice.

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10 steps · 10 nodes · 3 stages

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Path Steps

10 steps · 3 stages. Click any step to inspect it and see it on the Path Map.

Stage 1

Foundation

4 steps

Stage 2

Core Concepts

3 steps

Stage 3

Advanced Topics

3 steps

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Path Steps

Foundation

Core Concepts

Advanced Topics

Resources (0)

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